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GLOBAL MATERIALS SCIENCE Precision that travels across borders.

From advanced characterization to technical interpretation, Iran Catalyst connects rigorous laboratory work with confident industrial and research decisions.

Laboratory/Optics & Photonics/ICLAB-189
Optics & Photonics

Ellipsometry

Ellipsometry is provided within Iran Catalyst’s advanced materials characterization portfolio. Method selection, sample requirements and measurement conditions are technically reviewed before acceptance.

Request this analysisInternational pricing
TECHNICAL PROFILE

Service overview

Ellipsometry is provided within Iran Catalyst’s advanced materials characterization portfolio. Method selection, sample requirements and measurement conditions are technically reviewed before acceptance.

InstrumentEllipsometer
ModelSE800-ST
ManufacturerSENTECH
Turnaround20 days
Please do not ship samples until our team confirms feasibility and provides shipping instructions.

International sample shipping and handling charges are calculated separately and added to the final quotation.

USD

International pricing

Service optionNormalUrgent
Measurement of thin film thickness or optical parameters (refractive index and extinction coefficient)
$8.00Price on request

International sample shipping and handling charges are calculated separately and added to the final quotation. Technical feasibility is reviewed before payment or sample shipment.